Accurate Nanoscale Mapping of Electric Fields across Random Grain Boundaries in Polycrystalline Oxides Using Precession-Assisted 4D-STEM
Sangjun Kang, Christian Kübel(Karlsruhe Institute of Technology), Xiaoke Mu(Max Planck Institute for Intelligent Systems), Hyeyoung Cho, Ziming Ding(Beijing University of Technology), D Wang(Karlsruhe Institute of Technology), A. Klein(New Mexico State University), Wolfgang Rheinheimer(RWTH Aachen University), Mahmoud Serour, Anna Rose Nelson, Jakob Konstantin Laux, Bai-Xiang Xu, Maximilian Töllner(Karlsruhe Institute of Technology), Kai Ying Wang, Karsten Albe(Technische Universität Darmstadt)
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