Preserving subnanometer-scale ranging precision in advanced multiwavelength interferometry via elimination of error magnification
Ruitao Yang, Pengcheng Hu(Harbin Institute of Technology), Haisu Lv(Harbin Institute of Technology), FeiFei Yan, Hao Sun, Haijin Fu, Xiang Tian, Tuo Xu, Yisi Dong(Harbin Institute of Technology), Yang Hongxing, Jinxuan Wu(Harbin Institute of Technology)
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