Experimental Quantum Error Correction below the Surface Code Threshold via All-Microwave Leakage Suppression
Tan He(University of Science and Technology of China), YanCheng Liu(University of Science and Technology of China), J.F. Li(University of Science and Technology of China), K.Y. Chen(University of Science and Technology of China), Junyan Li(University of Science and Technology of China), Nanxing Liao(University of Science and Technology of China), Lianchen Han(University of Science and Technology of China), Jiacheng Gui(University of Science and Technology of China), M. Gong(University of Science and Technology of China), Xiawei Chen(University of Science and Technology of China), He-Liang Huang(Hefei National Center for Physical Sciences at Nanoscale), Honghong Jin(University of Science and Technology of China), Yuhuai Li(University of Science and Technology of China), R. N. Wang(University of Science and Technology of China), Daojin Fan(University of Science and Technology of China), Ke Liu(University of Science and Technology of China), Lei Jiang(University of Science and Technology of China), Bo Fan(University of Science and Technology of China), Shaojun Guo(University of Science and Technology of China), Sirui Cao(University of Science and Technology of China), Jianbin Cai(University of Science and Technology of China), W. W. Lin(University of Science and Technology of China), C. P. Jiang(University of Science and Technology of China), Linyin Hong(QuantumCTek (China)), Jinjin Li(University of Science and Technology of China), Xun Ding(University of Science and Technology of China), Yisen Hu(University of Science and Technology of China), Maliang Liu(Xidian University), Yuanhao Fu(University of Science and Technology of China), Dayu Li(University of Science and Technology of China), Danning Chen(QuantumCTek (China)), Yuan Li(University of Science and Technology of China), Wenhao Chu(QuantumCTek (China)), Zhuzhengqi Ding(University of Science and Technology of China), Jiaqi Li(University of Science and Technology of China), Zhiyuan Chen(University of Science and Technology of China), Na Li(University of Science and Technology of China), Tao Jiang(University of Science and Technology of China), Zuokai Jiang(University of Science and Technology of China), Cheng Guo(University of Science and Technology of China), Jiahao Bei(University of Science and Technology of China), Dongdong Li(University of Science and Technology of China), Yong-Heng Huo(University of Science and Technology of China), Shaowei Li(University of Science and Technology of China), Jin Lin(University of Science and Technology of China), Zhe Chen(University of Science and Technology of China), Zihua Chen(University of Science and Technology of China), Dongxin Gao(University of Science and Technology of China), Hui Deng(University of Science and Technology of China), Futian Liang(University of Science and Technology of China)
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