Soft Error Study on Advanced Process Node DRAMs at Component and System Level
Huifang Jiao(Shenzhen University), Zhiliang Hu(China Spallation Neutron Source), Xiaojie Wang(Beijing University of Posts and Telecommunications), Xiaomeng Qi(Shijiazhuang Yiling Pharmaceutical (China)), Haoyuan Pu(Huawei Technologies (China))
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