Analysis of Defect-Induced Performance Degradation in Gate-All-Around Nanosheet-Based 3D DRAM<br /><br />

Bushra Fatima(Jamia Millia Islamia), Mahendra Pakala(Applied Materials (United States)), S. K. Manhas, Arvind Kumar, Harsh Raju, Imtiyaz Ahmad Khan
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September 18, 2025
Cited by 1


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