Highly Tunable Synaptic Modulation in Photo‐Activated Remote Charge Trap Memory for Hardware‐Based Fault‐Tolerant Learning
Je‐Jun Lee(Korea Institute of Science and Technology), Jin‐Hong Park(LG (United States)), Sang Yeon Kim(Korea Institute of Science and Technology), Do Kyung Hwang(Korea University), Ju‐Hee Lee(Dongguk University), Hyungjun Kim(Korea Advanced Institute of Science and Technology), Jiwon Moon(Sungkyunkwan University), Hojin Choi(Sungkyunkwan University), Jeong‐Ick Cho(Sungkyunkwan University), Byoung‐Soo Yu(Korea Institute of Science and Technology), Seyong Oh(Sungkyunkwan University)
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