Broadband Near-Infrared Emission of Sm<sup>2+</sup> in Highly Stable (Ba,Sr)Al<sub>3</sub>Si<sub>3</sub>O<sub>4</sub>N<sub>5</sub> for Encryption and Nondestructive Inspection
Ying Lv(Xiamen University), Shihai You(Chinese Academy of Sciences), Wuqiang Li(Jiangxi University of Water Resources and Electric Power), Yunkai Li(China Agricultural University), Zhongyuan Li(Xinjiang University), Yu Liu(Chinese Academy of Science South America Center for Astronomy), Mengdi Xu(Ministry of Education of the People's Republic of China), Cunjian Lin(Xiamen University)
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