Broadband Near-Infrared Emission of Sm<sup>2+</sup> in Highly Stable (Ba,Sr)Al<sub>3</sub>Si<sub>3</sub>O<sub>4</sub>N<sub>5</sub> for Encryption and Nondestructive InspectionYing Lv, Shihai You, Yunkai Li et al.|ACS Materials Letters|2024Cited by 9