A Correction Method of Split C-V Characteristics in MOSFETs by Using Transmission Line Model for Accurate Extraction of Effective Mobility
Shinichi Takagi(The Open University of Japan), Mitsuru Takenaka(Bunkyo University), Xueyang Han(The University of Tokyo), Takahiro Mori(National Institute of Advanced Industrial Science and Technology), Kasidit Toprasertpong(The University of Tokyo), Yutong Chen(Dalian Ocean University), Hiroshi Oka(Kindai University)
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