Focus on sub-nanometer measurement accuracy: distortion and reconstruction of dynamic displacement in a fiber-optic microprobe sensor
Yisi Dong(Harbin Institute of Technology), Jiubin Tan(Harbin Institute of Technology), Ruitao Yang(Yulin Normal University), Yongkang Dong(Harbin Institute of Technology), Pengcheng Hu(Harbin Institute of Technology), Wenrui Luo(State Key Laboratory of Pollution Control and Resource Reuse), Wenwen Li(Jilin University), Chen Zhang(China Academy of Railway Sciences), Hongxing Yang(Harbin Institute of Technology), Haijin Fu(Harbin Institute of Technology)
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