A High-Accuracy, High-Speed Dynamic Performance Test Method for Heterodyne Interferometry Measurement Electronics
Yunke Sun(Harbin Institute of Technology), Jiubin Tan(Harbin Institute of Technology), Jianing Wang(Harbin Institute of Technology), Pengcheng Hu(Harbin Institute of Technology), Xing Xu(Harbin Institute of Technology), Wenjun Li(Harbin Institute of Technology)
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