A High-Accuracy, High-Speed Dynamic Performance Test Method for Heterodyne Interferometry Measurement Electronics

Yunke Sun(Harbin Institute of Technology), Jiubin Tan(Harbin Institute of Technology), Jianing Wang(Harbin Institute of Technology), Pengcheng Hu(Harbin Institute of Technology), Xing Xu(Harbin Institute of Technology), Wenjun Li(Harbin Institute of Technology)
IEEE Transactions on Instrumentation and Measurement
January 1, 2024
Cited by 6


Related Papers