Adaptive Scalpel Scanning Probe Microscopy for Enhanced Volumetric Sensing in Tomographic Analysis
Md Ashiqur Rahman Laskar(Arizona State University), Umberto Celano(Arizona State University), Sefaattin Tongay(Division of Materials Science and Engineering), Ondřej Novotný, Jan Neuman, Giuseppe Leonetti(Istituto Nazionale di Ricerca Metrologica), Gianluca Milano(Istituto Nazionale di Ricerca Metrologica)
Cited by 6
Related Papers
Ultrafast charge transfer in atomically thin MoS2/WS2 heterostructures
|Nature Nanotechnology|2014|2.3k
Monolayer behaviour in bulk ReS2 due to electronic and vibrational decoupling
|Nature Communications|2014|1.1k
Defects activated photoluminescence in two-dimensional semiconductors: interplay between bound, charged and free excitons
|Scientific Reports|2013|1.1k
Metrology for the next generation of semiconductor devices
|Nature Electronics|2018|479