Differential Sampling of AC Waveforms Based on a Commercial Digital-to-Analog Converter for Reference
Yanping Wang(Harbin Institute of Technology), Qing He(National Institute of Metrology), Yunfeng Lu(General Administration of Quality Supervision, Inspection and Quarantine), Jianting Zhao(National Institute of Metrology), Xiaogang Sun(Harbin Institute of Technology), Jifeng Qu(National Institute of Metrology), Kunli Zhou(National Institute of Metrology), Pengcheng Hu(Harbin Institute of Technology)
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