Structural Characterization of BaZrS(3-y)Sey Perovskite Thin Films via Scanning Transmission Electron Microscopy

Tigran Simonian(Trinity College Dublin), Valeria Nicolosi(Trinity College Dublin), Ida Sadeghi(Sharif University of Technology), Jack Van Sambeek(Massachusetts Institute of Technology), Kevin Ye(Massachusetts Institute of Technology), James M. LeBeau(North Carolina State University), Rafael Jaramillo(Paul Drude Institute for Solid State Electronics), Michael Xu(Massachusetts Institute of Technology)
Microscopy and Microanalysis
July 22, 2023
Cited by 0


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