Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
Di Wu(Zhengzhou University), Jiansheng Jie(Soochow University), Long Wen(Jinan University), Zhifeng Shi(Nankai University), Xiaoyan Ren(Zhengzhou University), Chongxin Shan(Zhengzhou University), Xinjian Li(The Wistar Institute), Meng Zhang(Imperial College London), Chenguang Guo(Zhengzhou University), Qin Chen(Jinan University), Longhui Zeng(Hong Kong Polytechnic University)
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