Phase-controlled van der Waals growth of wafer-scale 2D MoTe2 layers for integrated high-sensitivity broadband infrared photodetection
Di Wu(Zhengzhou University), Jiansheng Jie(Macau University of Science and Technology), Long Wen(Jinan University), Zhifeng Shi(Ministry of Education), Xiaoyan Ren(Zhengzhou University), Chongxin Shan(Zhengzhou University), Xinjian Li(Zhengzhou University), Meng Zhang(Suzhou Research Institute), Chenguang Guo(Zhengzhou University), Qin Chen(Jinan University), Longhui Zeng(Zhengzhou University)
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