Focus image scanning microscopy for sharp and gentle super-resolved microscopy
Giorgio Tortarolo(École Polytechnique Fédérale de Lausanne), Giuseppe Vicidomini(Italian Institute of Technology), Francesco Fersini(Italian Institute of Technology), Simonluca Piazza, Colin J. R. Sheppard(Italian Institute of Technology), Alessandro Zunino(Italian Institute of Technology), Paolo Bianchini(Italian Institute of Technology), Alberto Diaspro(Italian Institute of Technology), Marco Castello(Italian Institute of Technology), Sami Koho(University of Turku)
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