Focus image scanning microscopy for sharp and gentle super-resolved microscopy
Giorgio Tortarolo(École Polytechnique Fédérale de Lausanne), Giuseppe Vicidomini(Italian Institute of Technology), Francesco Fersini(Italian Institute of Technology), Simonluca Piazza, Colin J. R. Sheppard(Australian College of Optometry), Alessandro Zunino(Italian Institute of Technology), Paolo Bianchini(Italian Institute of Technology), Alberto Diaspro(Italian Institute of Technology), Marco Castello(IS Instruments (United Kingdom)), Sami Koho(University of Turku)
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