A robust and versatile platform for image scanning microscopy enabling super-resolution FLIM
Marco Castello(Italian Institute of Technology), Giuseppe Vicidomini(Italian Institute of Technology), Alberto Diaspro(Italian Institute of Technology), Sami Koho(University of Turku), Luca Pesce(Italian Institute of Technology), Alberto Tosi(Politecnico di Milano), Colin J. R. Sheppard(Italian Institute of Technology), Michele Oneto(Italian Institute of Technology), Luca Lanzanò(Italian Institute of Technology), Giorgio Tortarolo(École Polytechnique Fédérale de Lausanne), Paolo Bianchini(Italian Institute of Technology), Simone Pelicci(Italian Institute of Technology), Mauro Buttafava(Politecnico di Milano), Takahiro Deguchi(Italian Institute of Technology), Federica Villa(Politecnico di Milano)
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