Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures
N. A. Sanford(National Institute of Standards and Technology), Albert Davydov(National Institute of Standards and Technology), M. D. Brubaker(National Institute of Standards and Technology), Benjamin Klein(Kennesaw State University), Q. Zhang(Georgia Institute of Technology), A. Roshko(National Institute of Standards and Technology), Ashwin K. Rishinaramangalam(University of New Mexico), Paul T. Blanchard(Physical Measurement Laboratory), D. F. Feezell(University of New Mexico)
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