A Van Der Waals Reconfigurable Multi‐Valued Logic Device and Circuit Based on Tunable Negative‐Differential‐Resistance Phenomenon
Seunghwan Seo(Korea Advanced Institute of Science and Technology), Jin‐Hong Park(LG (United States)), Kyeong‐Bae Lee(Sungkyunkwan University), Taeran Lee(Sungkyunkwan University), Keun Heo(Sungkyunkwan University), Seojoo Lee(Korea University), Juncheol Kang(Sungkyunkwan University), Byeongchan Kim(Sungkyunkwan University), Maksim Andreev(Sungkyunkwan University), Kil‐Su Jung(Samsung (South Korea)), Ju‐Hee Lee(Dongguk University), Joo‐Ho Lee(Sungkyunkwan University), Geun Young Yeom(Jeonbuk National University), Ki Seok Kim(Gwangju Institute of Science and Technology), Jeong‐Ick Cho(Sungkyunkwan University), Sooyoung Jung(Suwon Research Institute), Hogeun Ahn(Massachusetts Institute of Technology)
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