Security challenges of MEMS devices in HI packaging
Aslam A. Khan(University of Florida), Navid Asadizanjani(University of Florida), Chengjie Xi(University of Florida), Keon Sahebkar(University of Florida), Ryan F. Need(University of Florida), Mark Tehranipoor(University of Florida)
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
May 1, 2022
Cited by 5
Related Papers
Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning
|Proceedings - International Symposium for Testing and Failure Analysis|2018|73
On malicious implants in PCBs throughout the supply chain
|Integration|2021|62
Review of THz-based semiconductor assurance
|Optical Engineering|2021|52
FICS-PCB: A Multi-Modal Image Dataset for Automated Printed Circuit Board Visual Inspection.
|IACR Cryptology ePrint Archive|2020|47