Machine Learning Assisted Counterfeit IC Detection through Non-destructive Infrared (IR) Spectroscopy Material Characterization

Chengjie Xi(University of Florida), Navid Asadizanjani(University of Florida), Aslam A. Khan(University of Florida), John True(University of Florida), Nathan Jessurun(University of Florida), Mark Tehranipoor(University of Florida)
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC)
May 1, 2022
10.1109/ectc51906.2022.00355
Cited by 9

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