Simultaneous high-resolution x-ray backlighting and self-emission imaging for laser-produced plasma diagnostics using a two-energy multilayer Kirkpatrick–Baez microscope
Shengzhen Yi(Tongji University), Zhanshan Wang(Tongji University), Jiaqin Dong(Institute of Plasma Physics), Erfu Guo(Institute of Plasma Physics), Li Jiang(Tongji University), Q.-S. Huang(Tongji University)
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