High-resolution X-ray flash radiography of Ti characteristic lines with multilayer Kirkpatrick–Baez microscope at the Shenguang-II Update laser facility
Shengzhen Yi(Tongji University), Zhanshan Wang(Tongji University), Yuqiu Gu(China Academy of Engineering Physics), Lai Wei(Sun Yat-sen University), Feng Zhang(China Academy of Engineering Physics), Qiushi Huang(Tongji University)
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