Destructive Reliability Analysis of Electromagnetic MEMS Micromirror Under Vibration Environment
Xiao-Yong Fang(Hunan Institute of Technology), Wenming Zhang(Ministry of Education), Ge Yan(Shanghai Jiao Tong University), Jiahao Wu(Huawei Technologies (China)), Xiu‐Yuan Li(Ministry of Education of the People's Republic of China), Kai‐Ming Hu(Zhengzhou University)
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