Maximizing Information: A Machine Learning Approach for Analysis of Complex Nanoscale Electromechanical Behavior in Defect‐Rich PZT Films
Fengyuan Zhang(Southern University of Science and Technology), Nazanin Bassiri‐Gharb(Georgia Institute of Technology), Yulian Yao(Queen's University Belfast), Aaron B. Naden(University of St Andrews), Brian J. Rodriguez(Oak Ridge National Laboratory), Kerisha Williams(Georgia Institute of Technology), Amit Kumar(Queen's University Belfast), D.N. Edwards(University of Cambridge), Sabine M. Neumayer(Oak Ridge National Laboratory)
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