Image scanning microscopy with multiphoton excitation or Bessel beam illumination
Colin J. R. Sheppard(Italian Institute of Technology), Alberto Diaspro(Italian Institute of Technology), Giuseppe Vicidomini(Italian Institute of Technology), Giorgio Tortarolo(École Polytechnique Fédérale de Lausanne), Marco Castello(Italian Institute of Technology), Eli Slenders(Italian Institute of Technology), Takahiro Deguchi(Italian Institute of Technology), Sami Koho(University of Turku)
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