Deep Learning Convolutional Neural Networks for Pharmaceutical Tablet Defect Detection

Xiangyu Ma(Tianjin University of Science and Technology), Daniel Skomski(Merck & Co., Inc., Rahway, NJ, USA (United States)), Hanmi Xi, Antong Chen, Robert Williams(The University of Texas at Austin), Mike Marsh(Object Research Systems (Canada)), Nada Kittikunakorn(The University of Texas at Austin), Arthur Mongeau(Object Research Systems (Canada)), Nicolas Piché(Object Research Systems (Canada)), Bradley Sorman
Microscopy and Microanalysis
July 30, 2020
Cited by 14


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