Application of Deep Learning Convolutional Neural Networks for Internal Tablet Defect Detection: High Accuracy, Throughput, and Adaptability

Xiangyu Ma(Tianjin University of Science and Technology), Daniel Skomski(Merck & Co., Inc., Rahway, NJ, USA (United States)), Hanmi Xi, Antong Chen, Mike Marsh(Object Research Systems (Canada)), Nada Kittikunakorn(The University of Texas at Austin), Robert O. Williams(Austin College), Arthur Mongeau(Object Research Systems (Canada)), Nicolas Piché(Object Research Systems (Canada)), Bradley Sorman
Journal of Pharmaceutical Sciences
January 23, 2020
Cited by 91


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