Fabrication and Characterization of a Novel Si Line Tunneling TFET With High Drive Current
Weijun Cheng(Tsinghua University), Jun Xu(Civil Aviation Administration of China), Huaxiang Yin(Chinese Academy of Sciences), Guofang Yu(Institute of Microelectronics), Gaobo Xu(University of Chinese Academy of Sciences), Renrong Liang(Institute of Microelectronics), Tian‐Ling Ren(Tsinghua University), Chao Zhao(Chinese Academy of Sciences), Shuqin Zhang(Aerospace Center Hospital)
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