Impact of Cycling Induced Intercell Trapped Charge on Retention Charge Loss in 3-D NAND Flash Memory

Xinlei Jia(Chinese Academy of Sciences), Zongliang Huo(Chinese Academy of Sciences), Wenzhe Wei(Beijing University of Technology), Dejia Huang(Duke University), Lei Jin(Chinese Academy of Sciences), Hongtao Liu, An Zhang, Kaiwei Li, Songmin Jiang, Jianwei Lu, Wei Hou(Chinese Academy of Sciences)

IEEE Journal of the Electron Devices Society

January 1, 2020

10.1109/jeds.2019.2963473

Cited by 30

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