Characterizing Endurance Degradation of Incremental Switching in Analog RRAM for Neuromorphic Systems

Meiran Zhao(Institute of Microelectronics), He Qian(University of Science and Technology of China), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Kanwen Wang(Huawei Technologies (United States)), Shimeng Yu(Georgia Institute of Technology), Xiaoyu Sun(Georgia Institute of Technology), Yue Xi(Tsinghua University), Qingtian Zhang(Tsinghua University), Peng Yao(Tsinghua University), Bin Gao(Chinese Academy of Sciences), Yuyi Liu(Hainan University), Xinyi Li(Institute of Microelectronics)
Unknown
December 1, 2018
10.1109/iedm.2018.8614664
Cited by 70

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