Improved Thermal Stability and Stress Immunity in Highly Scalable Junctionless FETs Using Enhanced-Depletion Channels
Chien Liu, Chun–Yen Chang(National Yang Ming Chiao Tung University), Bing-Yang Shih(National Yang Ming Chiao Tung University), Hsuan-Han Chen(National Yang Ming Chiao Tung University), Chia-Chi Fan(National Yang Ming Chiao Tung University), Wan‐Hsin Chen(National Yang Ming Chiao Tung University), Chih-Chieh Hsu(National Yang Ming Chiao Tung University), Ming-Huei Lin(National Yang Ming Chiao Tung University), Yu-Wen Hung(National Yang Ming Chiao Tung University), Yu-Chien Chiu(National Yang Ming Chiao Tung University), Chun‐Hu Cheng(National Taiwan Normal University), Yi‐Jia Shih(National Sun Yat-sen University), Wu-Ching Chou(National Yang Ming Chiao Tung University), Hsiao‐Hsuan Hsu(National Taipei University of Technology)
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