Structural determination of the Si(111) √3×√3-Bi surface by x-ray standing waves and scanning tunneling microscopy
J. C. Woicik(National Institute of Standards and Technology), J. A. Golovchenko(Lexington City Schools), Chien Liu, Michael J. Bedzyk(Northwestern University), G. E. Franklin(Harvard University), Raul E. Martinez(University of Córdoba), J. R. Patel, I.-S. Hwong(National Institute of Standards and Technology)
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