Two-step growth of high-quality Nb/(Bi<sub>0.5</sub>Sb<sub>0.5</sub>)<sub>2</sub>Te<sub>3</sub>/Nb heterostructures for topological Josephson junctions

Hui Zhang(University of Science and Technology of China), Guo Xing Miao(University of Waterloo), Changgan Zeng(University of Science and Technology of China), Deler Langenberg(Canadian Institute for Advanced Research), Lin Li(University of Science and Technology of China), Xiaodong Ma(University of Science and Technology of China)
Journal of materials research/Pratt's guide to venture capital sources
July 27, 2018
10.1557/jmr.2018.195
Cited by 10

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