Interlayer Transition and Infrared Photodetection in Atomically Thin Type-II MoTe<sub>2</sub>/MoS<sub>2</sub> van der Waals Heterostructures
Kenan Zhang(ETH Zurich), Ning Dai(Northwestern Polytechnical University), Changgan Zeng(University of Science and Technology of China), Xiangfeng Duan(California NanoSystems Institute), Xiaohao Zhou(Shanghai Institute of Technical Physics), Weida Hu(Shanghai Institute of Technical Physics), Guozhen Shen(Chinese Academy of Sciences), Guanghui Cheng(University of Science and Technology of China), Xin Chen(Medigene (Germany)), Kai Chang(Zhejiang University), Wei Wei(Northeast Petroleum University), Shuxia Wang(Chinese Academy of Sciences), Dong Zhang(Chinese Academy of Sciences), Peng Wang(Shanghai Institute of Technical Physics), Yan Sun(Jiangsu Normal University), Xingjun Wang(Fudan University), Tianning Zhang(Chinese Academy of Sciences), Tianxin Li(Shanghai Institute of Technical Physics), Weiwei Yu(Chinese Academy of Sciences), Hong Jin Fan(Nanyang Technological University)
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