Pile-up correction in characterizing single-photon avalanche diodes of high dark count rate

Xun Ding(University of Science and Technology of China), Kai Zang(Stanford University), Yue-Yang Fei(University of Science and Technology of China), Tianzhe Zheng(University of Science and Technology of China), Tao Su(University of Science and Technology of China), Matthew Morea(Stanford University), Ge Jin(University of Science and Technology of China), James S. Harris(Stanford University), Xiao Jiang(University of Science and Technology of China), Qiang Zhang(University of Science and Technology of China)
Optical and Quantum Electronics
June 1, 2018
10.1007/s11082-018-1517-x
Cited by 5

Abstract

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