A New Approach to Infrared Microspectroscopy: Adding FT-IR to a Light Microscope
Abstract
Journal Article A New Approach to Infrared Microspectroscopy: Adding FT-IR to a Light Microscope Get access John A Reffner, John A Reffner SensIR Technologies, Danbury CT 06810 Search for other works by this author on: Oxford Academic Google Scholar Donald K Wilks, Donald K Wilks SensIR Technologies, Danbury CT 06810 Search for other works by this author on: Oxford Academic Google Scholar Kenneth C Schreiber, Kenneth C Schreiber SensIR Technologies, Danbury CT 06810 Search for other works by this author on: Oxford Academic Google Scholar Robert V Burch Robert V Burch SensIR Technologies, Danbury CT 06810 Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 8, Issue S02, 1 August 2002, Pages 1526–1527, https://doi.org/10.1017/S1431927602104259 Published: 01 August 2002
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