Enhanced dielectric breakdown strength in Ni2O3 modified Al2O3-SiO2-TiO2 based dielectric ceramics
Ye Huang(Chinese Academy of Sciences), Xianlin Dong(Chinese Academy of Sciences), Yi Shen(China Academy of Engineering Physics), Yi Liu(Shenyang University of Chemical Technology), Xin Li(Chinese Academy of Sciences), Ying Chen(Chinese Academy of Sciences), Jinshui Shi(China Academy of Engineering Physics), Genshui Wang(Chinese Academy of Sciences), Liansheng Xia(China Academy of Engineering Physics)
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