Atomically Thin CBRAM Enabled by 2-D Materials: Scaling Behaviors and Performance Limits
Zhipeng Dong(University of Florida), Jing Guo(University of Science and Technology of China), Jesse Tice(Northrop Grumman (United States)), Lihua Zhang(Brookhaven National Laboratory), Han Wang(IBM Research - Thomas J. Watson Research Center), Huan Zhao(University of Southern California), Don DiMarzio(Northrop Grumman (United States)), Myung‐Geun Han(Brookhaven National Laboratory)
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