Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect

Ming‐Huei Lin(National Yang Ming Chiao Tung University), Chun-Yen Chang(National Yang Ming Chiao Tung University), Guan‐Lin Liou(National Taiwan Normal University), Yu‐Chien Chiu(National Yang Ming Chiao Tung University), Chia‐Chi Fan(National Yang Ming Chiao Tung University), Yi‐Jia Shih(National Sun Yat-sen University), Chun‐Hu Cheng(National Taiwan Normal University), Chien Liu
Unknown
June 1, 2017
Cited by 0


Related Papers