Ultrafast RESET Analysis of HfO<i><sub>x</sub></i>‐Based RRAM by Sub‐Nanosecond Pulses

Chen Wang(Fudan University), He Qian(University of Science and Technology of China), Lingjun Dai(Institute of Microelectronics), Huaqiang Wu(Beijing Advanced Sciences and Innovation Center), Bin Gao(Chinese Academy of Sciences), Xinyi Li(Institute of Microelectronics), Wei Wu(Institute of Microelectronics)
Advanced Electronic Materials
October 5, 2017
10.1002/aelm.201700263
Cited by 53

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