Removal of anti-Stokes emission background in STED microscopy by FPGA-based synchronous detection
Marco Castello(IS Instruments (United Kingdom)), Giuseppe Vicidomini(Italian Institute of Technology), Iván Coto Hernández(Italian Institute of Technology), Alberto Diaspro(Italian Institute of Technology), Giorgio Tortarolo(École Polytechnique Fédérale de Lausanne), Takahiro Deguchi(Italian Institute of Technology)
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