A novel pulsed STED microscopy method using FastFLIM and the phasor plots

Yuansheng Sun(Champaign Public Library), Beniamino Barbieri(Champaign Public Library), Alberto Diaspro(Unknown), Giuseppe Vicidomini(Italian Institute of Technology), Giorgio Tortarolo(Italian Institute of Technology), Shih-Chu Jeff Liao(Institute of Semitic Studies), Ulas Coskun(Institute of Semitic Studies), Paul R. Selvin(University of Illinois Urbana-Champaign), Kai-Wen Teng(University of Illinois System), Yuji Ishitsuka(University of Illinois Urbana-Champaign)
Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE
February 21, 2017
Cited by 9


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