Evolution of crystal imperfections during current-stress ageing tests of green InGaN light-emitting diodes

Yue Lin(Xiamen University), Zhuguang Liu, Wei Yan(Shandong University of Traditional Chinese Medicine), Zhangbao Peng(Xiamen University), Yijun Lü(Xiamen University), Tingzhu Wu(Xiamen University), Yulin Gao(Xiamen University), Tien‐Mo Shih(Xiamen University), Zhong Chen(Xiamen University), Ziquan Guo(Xiamen University)
Applied Physics Express
August 2, 2016
Cited by 7


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