Radiation-induced electrical degradation in crystalline<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">Al</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math><mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">O</mml:mi></mml:mrow><mml:mrow><mml:mn>3</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>
Xiangfu Zong(Fudan University), C.H. Sellers(Fudan University), Song Liu(Hunan University), Yi Chen(Lawrence Berkeley National Laboratory), Bruce D. Evans(Fudan University), R. González(Fudan University), Zhong-chi Wu(Fudan University), Y. Chen(Fudan University), Cheng-Fu Shen(Fudan University)
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