Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology
Jun-Ho Cheon(SK Group (South Korea)), Jun Hyun Chun(SK Group (South Korea)), Aravinthan Athmanathan(IBM Research - Zurich), Taek‐Seung Kim(Harvard University), Changyong Ahn(SK Group (South Korea)), In-Soo Lee(SK Group (South Korea)), Miloš Stanisavljević(IBM Research - Zurich), Nikolaos Papandreou(IBM Research - Zurich), Minchul Shin(SK Group (South Korea)), Jong Ho Kang(SK Group (South Korea)), Evangelos Eleftheriou(IBM Research - Zurich)
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