Fast step-down set algorithm of resistive switching memory with low programming energy and significant reliability improvement
Ying Shirley Meng(Xihua University), Jin Wu(Rambus (United States)), Benteng Chen(Fudan University), Xiaoyong Xue(Beijing University of Chinese Medicine), Qingtian Zou(The University of Texas Southwestern Medical Center), Yandan Lin, Rongqin Huang(Fudan University), J. G. Yang(Fudan University), Yali Song(Shandong University)
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