Residual strain measurements in InGaAs metamorphic buffer layers on GaAs
V. Bellani(University of Pavia), Giovanna Trevisi(Institute of Materials for Electronics and Magnetism), S. Franchi(Institute of Materials for Electronics and Magnetism), F. Germini(Institute of Materials for Electronics and Magnetism), Pietro Galinetto(University of Pavia), P. Frigeri(Institute of Materials for Electronics and Magnetism), C. Bocchi(Institute of Materials for Electronics and Magnetism), L. Seravalli(Institute of Materials for Electronics and Magnetism), M. Patrini(University of Pavia), M. Geddo(University of Parma), G. Guizzetti(University of Pavia), L. Nasi(Institute of Materials for Electronics and Magnetism), T. Ciabattoni(University of Pavia)
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