Schottky-Barrier Si Nanowire MOSFET: Effects of Source/Drain Metals and Gate Dielectrics
Weifeng Yang(National University of Singapore), Byungjin Cho(Chungbuk National University), Hanlu Gu(National University of Singapore), S. J. Whang(National University of Singapore), Sungjoo Lee(Tohoku University), Haichen Zhu(National University of Singapore)
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