Shot-Noise Suppression in the Single-Electron Tunneling Regime

Abstract

Electrical current fluctuations through tunnel junctions are studied with a scanning-tunneling microscope. For single-tunnel junctions classical Poisson shot noise is observed, indicative for uncorrelated tunneling of electrons. For double-barrier tunnel junctions, formed by a nanoparticle between tip and surface, the shot noise is observed to be suppressed below the Poisson value. For strongly asymmetric junctions, where a Coulomb staircase is observed in the current-voltage characteristic, the shot-noise suppression is periodic in the applied voltage. This originates from correlations in the transfer of electrons imposed by single-electron charging effects.